发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device and its manufacturing method capable of suppressing enlargement of a chip area while highly precisely performing dicing. SOLUTION: An inspection pad 3 connected to a circuit area 1 is formed of the circuit area 1 and a connection part 4 on a wafer 7. The inspection pad 3 comprises a plurality of metal layers, and a contact 5 connecting the metal layers is formed on only an edge part 3b being an area remote from the circuit area 1 in at least a pair of the opposite metal layers. When the wafer 7 is diced so as to separate the inspection pad 3 from the circuit area 1, the edge part 3b out of the inspection pad 3 is diced by using a dicing blade 21 having a removable blade width B.
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申请公布号 |
JP2003077968(A) |
申请公布日期 |
2003.03.14 |
申请号 |
JP20010267367 |
申请日期 |
2001.09.04 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
TAKAHASHI KEITA |
分类号 |
H01L21/66;H01L21/301;(IPC1-7):H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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