发明名称 AUTOMATIC INSPECTION DEVICE AND METHOD AND METHOD FOR PROCESSING IMAGE SIGNAL
摘要 PROBLEM TO BE SOLVED: To solve the problem that, though repetitive work of accurately performing a rule given by a human beforehand is a strong point, intellectual work of flexibly adapting to an environmental change as the human and performing learning from examples can not be expected in a conventional pattern recognition technique. SOLUTION: An automatic inspection device is composed of a photoelectric converter for converting image information of an object to be inspected to electric signals, a processor for processing the electric signals from the photoelectric converter so as to improve the signals and an arithmetic unit provided with a contention type neural network performing identification and evaluation to learned data and un-learned data on the basis of a specified standard, for which output from the processor is input.
申请公布号 JP2003076991(A) 申请公布日期 2003.03.14
申请号 JP20010262690 申请日期 2001.08.31
申请人 JAPAN SCIENCE & TECHNOLOGY CORP 发明人 DAIMATSU SHIGERU
分类号 G01N21/88;G06T1/00;G06T7/00 主分类号 G01N21/88
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