| 摘要 |
<p>A method for robust optimization of semiconductor product and manufacture design using a search engine. The method comprises selecting one of first and second candidates based on at least one objective function, sampling the first candidate and determining one or more sample objective function values for the first candidate; sampling the second candidate and determining one or more sample objective function values for the second candidate; statistically determining, based on the sampled objectivefunction values, corresponding first and second statistical estimators of design quality; and comparing the first and second statistical estimators of design quality.</p> |
