发明名称 SURFACE TEXTURE DETERMINATION METHOD AND APPARATUS
摘要 A method of determining the distribution of a type of surface from a backscatter profile such as that produced by sidescan sonar. Wavelet analysis is performed on the backscatter profile and moments of the energy coefficients from selected scale bands are calculated. The moments of the energy coefficients are used to characterise the surface.
申请公布号 WO03021288(A2) 申请公布日期 2003.03.13
申请号 WO2002GB03944 申请日期 2002.08.29
申请人 ISIS INNOVATION LIMITED;SMITH, PENELOPE, JEAN;ATALLAH, LOUIS, NICOLAS 发明人 SMITH, PENELOPE, JEAN;ATALLAH, LOUIS, NICOLAS
分类号 G01S7/539;G01S15/89;G01V1/28 主分类号 G01S7/539
代理机构 代理人
主权项
地址