发明名称 Magnetic element with an improved magnetoresistance ratio and fabricating method thereof
摘要 An improved and novel magnetic element and fabrication method. The magnetic element (10;30) including a bottom pinned ferromagnetic layer (12;32) and a top pinned ferromagnetic layer (20;40) fabricated antiparallel to one another. The magnetic element (10;30) further including a bottom tunnel barrier layer (14;34), a free ferromagnetic layer (16;46 and 48) and a top tunnel barrier layer (18;38) formed between the bottom pinned ferromagnetic layer (12;32) and the top pinned ferromagnetic layer (20;40). The structure is defined as including two (2) tunnel barrier layers in which one tunnel barrier layer is normal (18) and one is reversed (14), or a structure in which the two tunnel barrier layers are of the same type (34; 38) with the structure further includes a SAF structure (36) to allow for consistently changing magnetoresistance ratios across both tunnel barriers. The magnetic element (10;30) having an improved magnetoresistance ratio and a decrease in voltage dependence.
申请公布号 US2003048658(A1) 申请公布日期 2003.03.13
申请号 US20020224253 申请日期 2002.08.20
申请人 CHEN EUGENE YOUJUN 发明人 CHEN EUGENE YOUJUN
分类号 G11C11/15;H01F10/32;H01F41/30;H01L21/8246;H01L27/105;H01L43/08;H01L43/12;(IPC1-7):G11C11/00 主分类号 G11C11/15
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