发明名称 Controllable and testable oscillator apparatus for an integrated circuit
摘要 An integrated circuit (IC) includes an internal clock generator apparatus that provides various modes of operation of the integrated circuit. The internal clock generator apparatus includes a clock generator portion that is operable to provide a clock signal for various circuitry/logic of the integrated circuit and a control portion that is operable to receive a control signal to cause the integrated circuit to operate in one of several modes. In particular, the clock generator apparatus is responsive to the control signal, preferably from an external source, to bypass the clock signal, introduce a test clock signal for digital testing, and isolate and/or measure a delay through the clock generator portion of the clock generator apparatus.
申请公布号 US2003048142(A1) 申请公布日期 2003.03.13
申请号 US20020239110 申请日期 2002.09.19
申请人 ALBEAN DAVID LAWRENCE 发明人 ALBEAN DAVID LAWRENCE
分类号 G01R31/28;G01R31/30;G01R31/3185;G06F1/04;H01L21/822;H01L27/04;H03K3/03;(IPC1-7):H03B1/00 主分类号 G01R31/28
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