APPARATUS FOR MEASURING INFORMATION ON PARTICULAR COMPONENT

摘要

An apparatus and a method for measuring information on a particular component capable of obtaining a high signal intensity without being affected by a disturbing substance on a sample surface. The apparatus for measuring information on a particular component includes a light source 1, an ATR element 2 for irradiating light from the light source 1 to a sample and receiving light coming back from the sample, a photodetector 4 for detecting the light coming back to the ATR element, and a polarizer 3 arranged on an optical path between the light source 1 and the photodetector 4 in such a manner that more P-polarized component is passed than the other polarized components. According to the light detected by the photodetector 4, information on a particular component such as concentration in the sample is measured.