发明名称 SUBSTRATE HOLDER FOR EVALUATING FILM, AND METHOD FOR EVALUATING FILM
摘要 PROBLEM TO BE SOLVED: To provide a substrate holder for evaluating a film, which can evaluate the defect density in a formed film on a large-scale substrate containing a sodium content, such as soda glass, and provide a method for evaluating film. SOLUTION: The substrate holder has several portions 2 for mounting substrates on a metallic plate body 1, and inlays quartz substrates 2a as non- alkali substrates in them. The quartz substrates 2a are fixed with fixing members 3 and 4, which are installed on the both sides of the plate body 1, and are made to be removable. The corners of each fixing member 3 provided on the surface side to be film formed are chamfered, and each fixing member 4 installed on the opposite side is composed of thin SUS foils, or the like. The plate body 1 comprises slits formed on the edge to prevent the camber of it.
申请公布号 JP2003073839(A) 申请公布日期 2003.03.12
申请号 JP20010256686 申请日期 2001.08.27
申请人 MITSUBISHI HEAVY IND LTD 发明人 SASAGAWA EISHIRO;MIYAZONO NAOYUKI;UENO MOICHI
分类号 C23C16/52;H01L21/66;H01L31/04;(IPC1-7):C23C16/52 主分类号 C23C16/52
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