发明名称 Method and apparatus for application of proximity correction with relative segmentation
摘要 The present invention is a method and apparatus for applying one-dimensional proximity correction to a piece of a mask pattern, by segmenting a first piece of a mask pattern with horizontal dividing lines into a plurality of segments, segmenting a second piece of said mask pattern with said horizontal dividing lines into a second plurality of segments, and applying proximity correction to a first segment from said first plurality of segments taking into consideration a second segment from said second plurality of segments.
申请公布号 US6532585(B1) 申请公布日期 2003.03.11
申请号 US20000714370 申请日期 2000.11.14
申请人 LSI LOGIC CORPORATION 发明人 PETRANOVIC DUSAN;SCEPANOVIC RANKO;JONES EDWIN;SCHINELLA RICHARD;PASCH NICHOLAS F.;GARZA MARIO;CHAO KEITH K.;JENSEN JOHN V.;EIB NICHOLAS K.
分类号 G03F1/14;G03F7/20;(IPC1-7):G06F17/50 主分类号 G03F1/14
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