| 摘要 |
PURPOSE: An LCD testing probe card is provided to integrally form an LCD connecting part and a substrate connecting part for the simultaneous connection between the LCD pattern and the PCB pattern while minimizing the length between the connection parts, thereby promoting the compacting and minimizing the probe card. CONSTITUTION: A probe card for testing a liquid crystal display device includes an assembly holder(10), a substrate holder(20) fixed to a side of a bottom surface of the assembly holder, a needle holder(30) coupled to the other side of the assembly holder correspondingly to the substrate holder, a printed circuit board(40) attached to a bottom surface of the substrate holder and attached with a drive IC on a top surface, a guide plate(50) attached to a bottom surface of the needle holder, and a needle plate(60) formed by patterning a thin silicon plate. The guide plate is opened upwardly by a predetermined interval in the width direction and formed with needle insertion grooves for vertically penetrating front end part of the needle holder by a predetermined length. The needle plate is made out of a securing part to be inserted into the needle insertion grooves to be secured to a bottom surface of the guide plate, an LCD pattern connecting part extended downwardly in the shape of L at a side of the securing part and protruded forwardly more than the needle holder to have lifting elasticity, and a substrate connecting part extended from an upper part of the securing part to the bottom part of the PCB to be elastically connected to the pattern of the PCB.
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