METHOD FOR FABRICATING CAPACITOR FOR SEMICONDUCTOR DEVICE
摘要
PURPOSE: A method for fabricating a capacitor for a semiconductor device is provided to prevent oxidation of a lower electrode by crystallizing sequentially amorphous tantalum oxide layers. CONSTITUTION: The first amorphous tantalum oxide layer is formed on an upper portion of a lower electrode(110). The first amorphous tantalum oxide layer is transformed to the first crystalline tantalum oxide layer(120a) by performing a furnace annealing process for the resultant. The second amorphous tantalum oxide layer is formed on the first crystalline tantalum oxide layer(120a). The second amorphous tantalum oxide layer is transformed to the second crystalline tantalum oxide layer(130a) by performing the furnace annealing process for the resultant. An upper electrode is formed on the second crystalline tantalum oxide layer(130a).
申请公布号
KR20030020640(A)
申请公布日期
2003.03.10
申请号
KR20010054047
申请日期
2001.09.04
申请人
JU SUNG ENGNEERING CO., LTD.
发明人
JIN, YU CHAN;JUNG, HYEON MUK;KANG, SEUNG TAE;KIM, GEUN HO;KIM, MYEONG GYU;LEE, HYEON HO;OH, WON SANG;PARK, MUN SU