发明名称 |
GAP CONTROL REVIEW APPARATUS FOR SEMICONDUCTOR PROCESS CHAMBER |
摘要 |
PURPOSE: A gap control review apparatus for a semiconductor process chamber is provided to identify easily a gal count operation by using a digital display portion though a gap counter error is generated from an encoder. CONSTITUTION: A gap control apparatus is formed with a driving motor(22), an encoder(23), and a digital display portion(24). The driving motor(22) is used for controlling a gap between electrode plates. An upper electrode plate is elevated by the driving motor(22) in order to control a gap. The encoder(23) is used for performing a gap counting operation in the driving motor(22). A digital indicator(24) is installed at the encoder(23) in order to identify the cap counting operation. A reset button(25) is formed at the digital display portion(24).
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申请公布号 |
KR20030020134(A) |
申请公布日期 |
2003.03.08 |
申请号 |
KR20010053810 |
申请日期 |
2001.09.03 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, SEONG SU |
分类号 |
H01L21/306;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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