发明名称 PLASMA TREATMENT APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a plasma-treatment apparatus by which the maintenance of the outer wall of a chamber is made possible without removing a magnetic field generating mechanism. SOLUTION: The plasma-treatment apparatus is for performing a plasma treatment to a semiconductor wafer 30 by generating an electric field with an electric field generating means 10 while forming a magnetic field with a magnetic field generating mechanism 21. The magnetic field generating mechanism 21 comprises the outer wall almost in a cylindrical shape, a magnetic field generating part formed inside the outer wall, a space formed at the magnetic field generating part in accordance with the magnitude of desired magnetic field, a window fitted to the portion corresponding to the space of the outer wall, and a lid detachably fitted to the window part.
申请公布号 JP2003068714(A) 申请公布日期 2003.03.07
申请号 JP20010257820 申请日期 2001.08.28
申请人 TOKYO ELECTRON LTD 发明人 ONO HIROO
分类号 H05H1/46;B01J3/00;B01J19/08;H01L21/205;H01L21/302;H01L21/3065 主分类号 H05H1/46
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