发明名称 |
METHOD FOR FINDING NOISE AT OUTPUT BY SIMULATING NOISE AT INPUT OF STATIC GATE |
摘要 |
PROBLEM TO BE SOLVED: To provide a means for avoiding a trouble of a noise in designing an integrated circuit easily. SOLUTION: The present invention is a method to find a noise at the output of a static logic gate by simulating a noise at the input of the static logic gate. This method identifies PFET and NFET used when driving the input of the static gate by a particular voltage pattern. When an FET is identified, a P/N ratio is calculated for every possible input combination. The maximum P/N ratio or the minimum P/N ratio is selected and a noise signal at the input of the gate can be simulated. The signal arising at the output of the gate is a noise which can be used to evaluate other circuits as to noise problems. By using the noise created in this method, a designer of an integrated circuit is able to create a computer simulation which makes an electrical environment where an integrated circuit operates into a model in a satisfactory manner.
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申请公布号 |
JP2003067440(A) |
申请公布日期 |
2003.03.07 |
申请号 |
JP20020126588 |
申请日期 |
2002.04.26 |
申请人 |
HEWLETT PACKARD CO <HP> |
发明人 |
KELLER S BRANDON;ROGERS GREGORY D |
分类号 |
G06F17/50;H01L21/82;(IPC1-7):G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
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