| 摘要 |
Tandem mass spectrometry involves positioning a dissociation system (2) immediately after an ion source (1) and before a magnetic sector (4), and using a multichannel ion detector (7) capable of simultaneously detecting ions reaching its detection surface at different positions. Tandem mass spectrometry involves positioning a dissociation system (2) immediately after an ion source (1) and before a magnetic sector (4), and using a multichannel ion detector (7) capable of simultaneously detecting ions reaching its detection surface at different positions. The process uses a device with a vacuum chamber containing in the order of the ion trajectory, an ion source (1), a dissociation system (2), a fine slit (3), a magnetic sector (4), a fine slit (5), an electrostatic analyzer (6) and a multichannel ion detector (7).
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