发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide a high frequency bipolar transistor having excellent high frequency characteristics. SOLUTION: After an insulation film is partly formed on a first epitaxial layer on a collector region, a second epitaxial layer to be a base electrode is formed on the side face of the insulation film on the first epitaxial layer. After the insulation film is selectively removed to form an opening part, a sidewall and an emitter electrode are formed in this opening part.
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申请公布号 |
JP2003068749(A) |
申请公布日期 |
2003.03.07 |
申请号 |
JP20010252370 |
申请日期 |
2001.08.23 |
申请人 |
TOSHIBA CORP |
发明人 |
YAMADA YOSHIAKI;ISHIDA YUKITO |
分类号 |
H01L29/417;H01L21/331;H01L29/732;(IPC1-7):H01L21/331 |
主分类号 |
H01L29/417 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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