发明名称 DRY ETCHING METHOD FOR TRANSPARENT CONDUCTIVE FILM
摘要 PROBLEM TO BE SOLVED: To provide a dry etching method capable of increasing an etching rate for a transparent conductive film on a substrate to 1500 to 2000Å/min. without impairing a selection ratio and also suppressing dusting. SOLUTION: When the transparent conductive film on the substrate is etched by using the high frequency plasma of etching gas, the transparent conductive film is heated to 130 deg.C or higher by using at least gaseous hydrogen iodide as the etching gas to heat the inside wall of a vacuum chamber to 80 to 200 deg.C.
申请公布号 JP2003068155(A) 申请公布日期 2003.03.07
申请号 JP20010260626 申请日期 2001.08.30
申请人 ULVAC JAPAN LTD 发明人 TAKEI HIDEO;SAKIO SUSUMU;MIZUNO KENJI
分类号 C23F4/00;H01B13/00;(IPC1-7):H01B13/00 主分类号 C23F4/00
代理机构 代理人
主权项
地址