| 摘要 |
PROBLEM TO BE SOLVED: To provide an integrated circuit (IC1) comprising a functional logic circuit (1) and flash EEPROM (2), which are connected to a pad arrangement (PAD) via mixing devices (IMUX and OMUX). SOLUTION: The pad arrangement (PAD) comprises two connection pads (CP1 and CP2), and the good 'bondability' of the pad is assured by probing work for two times at most in the respective connection pads. This is particularly useful in the present case of combined functional logic and flash EEPROM, where three probings are generally required for the flash test of EEPROM, the digital test of the functional logic circuit and the analog test of the circuit. In a preferred embodiment, the integrated circuit (IC2) comprises a first set of dedicated connection pads coupled to the functional logic circuit (1) and a distinct second set of dedicated connection pads coupled to flash EEPROM (2).
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