发明名称 SUBSTRATE PROCESSING SYSTEM FOR PERFORMING EXPOSURE PROCESS IN GAS ATMOSPHERE
摘要 PURPOSE: A substrate processing system for performing exposure process in gas atmosphere is provided to precisely control a reflow distance L of the photo resist patterns when element patterns are formed by using a reflow process of photo resist patterns. CONSTITUTION: A substrate processing system(100) comprises an exposure process chamber(101), a gas introducing mechanism(120) which introduces an exposure process gas into the exposure process chamber, and a gas spray mechanism which sprays the exposure process gas onto a substrate. The exposure process chamber has a lower chamber(10) and an upper chamber(20). The lower chamber and the upper chamber are joined together via an O-ring(121) attached to the lower chamber, and thereby an airtight space is formed within the chamber. A gas spray mechanism(110) comprises a plurality of gas introducing pipes(24), gas diffusing members(23) each of which is attached to an end portion of the gas introducing pipe, a gas spouting plate(21), and a frame(212) for the gas spouting plate which fixes the gas spouting plate and which defines an area of gas spouting.
申请公布号 KR20030019896(A) 申请公布日期 2003.03.07
申请号 KR20020050206 申请日期 2002.08.23
申请人 NEC LCD TECHNOLOGIES, CO., LTD. 发明人 IIO YOSHIHIDE;IKEDA MASAKI;KIDO SHUSAKU
分类号 H01L21/027;H01L21/00;H01L21/20;(IPC1-7):H01L21/20 主分类号 H01L21/027
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