INSPECTING METHOD, SEMICONDUCTOR DEVICE, AND DISPLAY

摘要

A method for inspecting a semiconductor substrate constituting a liquid crystal display by reliably detecting a change in potential due to a failure of a pixel cell driver circuit irrespective of the decreased ratio of the pixel capacitance to the wiring capacitance because of the small size of the display and higher definition. The method comprises a charge retaining step of allowing pixel capacitors connected to pixel switches selected from among all the pixel switches connected to one data line to retain the charge and a detecting step for simultaneously detecting the charge retained by the pixel capacitors at the charge retaining step from the one data line.