发明名称 Atomic layer deposition of metal oxide and/or low asymmetrical tunnel barrier interploy insulators
摘要 Structures and methods for programmable array type logic and/or memory devices with asymmetrical low tunnel barrier intergate insulators are provided. The programmable array type logic and/or memory devices include non-volatile memory which has a first source/drain region and a second source/drain region separated by a channel region in a substrate. A floating gate opposing the channel region and is separated therefrom by a gate oxide. A control gate opposes the floating gate. The control gate is separated from the floating gate by an asymmetrical low tunnel barrier intergate insulator formed by atomic layer deposition. The asymmetrical low tunnel barrier intergate insulator includes a metal oxide insulator selected from the group consisting of Al2O3, Ta2O5, TiO2, ZrO2, Nb2O5, SrBi2Ta2O3, SrTiO3, PbTiO3, and PbZrO3.
申请公布号 US2003045082(A1) 申请公布日期 2003.03.06
申请号 US20020081818 申请日期 2002.02.20
申请人 发明人 ELDRIDGE JEROME M.;AHN KIE Y.;FORBES LEONARD
分类号 G11C16/04;H01L21/8247;H01L27/115;H01L29/51;H01L29/788;(IPC1-7):H01L21/320 主分类号 G11C16/04
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