TESTER FOR SEMICONDUCTOR INTEGRATED CIRCUIT AND ITS TESTING METHOD

摘要

PURPOSE: To provide a tester for semiconductor integrated circuit and its testing method, capable of performing a test for an A/D converter circuit and D/A converter circuit with high accuracy at a high speed with space saving for a mixed signal type semiconductor integrated circuit having the A/D converter circuit and D/A converter circuit. CONSTITUTION: A test auxiliary device (BOST device) is disposed near a test circuit board for giving and receiving a signal to and from the semiconductor integrated circuit to be tested, and the testing D/A converter circuit and testing A/D converter circuit of the test auxiliary device, a measurement data memory and an analyzing part are respectively mounted on separate circuit boards.