发明名称 Chemical-mechanical-polishing station
摘要 A small footprint, integrated and automated semiconductor wafer processing system for planarizing semiconductor wafers. That processing system includes a wafer load station, at least one CMP polishing system, and at least one cleaning system. Also included is at least one wafer unload station and a robotic system. The robotic system, which includes from two to six robotic movers, moves semiconductor wafers through the semiconductor wafer processing system. The semiconductor wafer processing system can also include a buffer system for temporarily holding semiconductor wafers. The buffer system, the robotic system, the cleaning system, the wafer load station, and/or the wafer unload station in some applications are capable of Z-axis motion. CMP polishing systems and cleaning systems can be vertically or linearly stacked.
申请公布号 US2003045107(A1) 申请公布日期 2003.03.06
申请号 US20010943946 申请日期 2001.08.31
申请人 JEONG IN KWON 发明人 JEONG IN KWON
分类号 H01L21/00;(IPC1-7):H01L21/302;H01L21/461 主分类号 H01L21/00
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