发明名称 |
Electrodeposition coating film thickness calculating method, recording medium stored with film thickness calculating program and readable by means of computer, and electrodeposition coating film thickness simulation apparatus |
摘要 |
A finite element model of the environment of electrodeposit coating is prepared by a simulation method, change of an electric field in an electrolytic cell for the case of electrodeposit coating is simulated, the distribution of currents then flowing through individual parts of a finite element model of a to-be-coated object is obtained, the electric variables of currents flowing through the respective surfaces of the finite elements of the to-be-coated object are obtained and accumulated according to the current distribution, the thickness of an electrodeposition coating film is calculated as h=SIGMAKFICC.E.DELTAt/rho if the cumulative electric variable is higher than a deposition starting electric variable such that a fixed concentration is attained by OH- or H+.
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申请公布号 |
US2003042135(A1) |
申请公布日期 |
2003.03.06 |
申请号 |
US20020132307 |
申请日期 |
2002.04.26 |
申请人 |
C. UYEMURA & CO., LTD. |
发明人 |
KATSUMARU SHINJI;YAGESAWA KIYOTAKA;WADA TAKASHI;OHARA KATSUHIKO |
分类号 |
C25D13/14;C25D13/22;C25D21/12;(IPC1-7):C25C3/16;C25B9/04;C25B15/00 |
主分类号 |
C25D13/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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