发明名称 Electrodeposition coating film thickness calculating method, recording medium stored with film thickness calculating program and readable by means of computer, and electrodeposition coating film thickness simulation apparatus
摘要 A finite element model of the environment of electrodeposit coating is prepared by a simulation method, change of an electric field in an electrolytic cell for the case of electrodeposit coating is simulated, the distribution of currents then flowing through individual parts of a finite element model of a to-be-coated object is obtained, the electric variables of currents flowing through the respective surfaces of the finite elements of the to-be-coated object are obtained and accumulated according to the current distribution, the thickness of an electrodeposition coating film is calculated as h=SIGMAKFICC.E.DELTAt/rho if the cumulative electric variable is higher than a deposition starting electric variable such that a fixed concentration is attained by OH- or H+.
申请公布号 US2003042135(A1) 申请公布日期 2003.03.06
申请号 US20020132307 申请日期 2002.04.26
申请人 C. UYEMURA & CO., LTD. 发明人 KATSUMARU SHINJI;YAGESAWA KIYOTAKA;WADA TAKASHI;OHARA KATSUHIKO
分类号 C25D13/14;C25D13/22;C25D21/12;(IPC1-7):C25C3/16;C25B9/04;C25B15/00 主分类号 C25D13/14
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