发明名称 Method and apparatus for photon activation positron annihilation analysis
摘要 Non-destructive testing apparatus according to one embodiment of the invention comprises a photon source. The photon source produces photons having predetermined energies and directs the photons toward a specimen being tested. The photons from the photon source result in the creation of positrons within the specimen being tested. A detector positioned adjacent the specimen being tested detects gamma rays produced by annihilation of positrons with electrons which are indicative of a material characteristic of the specimen being tested.
申请公布号 US2003043951(A1) 申请公布日期 2003.03.06
申请号 US20010932531 申请日期 2001.08.17
申请人 BECHTEL BWTX IDAHO, LLC 发明人 AKERS DOUGLAS W.
分类号 G01T;G01T1/29;G21G1/12;(IPC1-7):G21G1/12 主分类号 G01T
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