发明名称 |
Method and apparatus for photon activation positron annihilation analysis |
摘要 |
Non-destructive testing apparatus according to one embodiment of the invention comprises a photon source. The photon source produces photons having predetermined energies and directs the photons toward a specimen being tested. The photons from the photon source result in the creation of positrons within the specimen being tested. A detector positioned adjacent the specimen being tested detects gamma rays produced by annihilation of positrons with electrons which are indicative of a material characteristic of the specimen being tested.
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申请公布号 |
US2003043951(A1) |
申请公布日期 |
2003.03.06 |
申请号 |
US20010932531 |
申请日期 |
2001.08.17 |
申请人 |
BECHTEL BWTX IDAHO, LLC |
发明人 |
AKERS DOUGLAS W. |
分类号 |
G01T;G01T1/29;G21G1/12;(IPC1-7):G21G1/12 |
主分类号 |
G01T |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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