发明名称 Production of isolation trenches between active regions during the manufacture of integrated circuits, especially DRAMs, comprises etching trenches filled with oxide in semiconductor substrate to isolate the active regions, and processing
摘要 Production of isolation trenches between active regions during the manufacture of integrated circuits, especially DRAMs, comprises etching trenches filled with an oxide in a semiconductor substrate (10) to isolate the active regions and form deep trenches (12) filled with polysilicon (14); forming a silicon nitride layer (18) on the surface of the substrate; covering the whole surface of the substrate and the polysilicon with a hard mask layer (20); and forming lateral isolation trenches next to the active regions. Preferred Features: The surface of the polysilicon in the trenches lies than the surface of the silicon nitride layer. The silicon nitride layer is removed by etching on bars between the trenches for a pair of storage capacitors.
申请公布号 DE10139430(A1) 申请公布日期 2003.03.06
申请号 DE20011039430 申请日期 2001.08.10
申请人 INFINEON TECHNOLOGIES AG 发明人 EFFERENN, DIRK;MOLL, HANS-PETER;GRUENING, ULRIKE
分类号 H01L21/762;H01L21/8242;(IPC1-7):H01L21/762 主分类号 H01L21/762
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