| 摘要 |
An adaptive white defect correction method and an image-pickup apparatus implementing the method. Pixel data on lines located above and below a white defect pixel are judged according to a predetermined algorithm to determine which of a plurality of previously supposed kinds of pattern most resembles an image obtained near a white defect pixel. On the basis of a result of the determination, suitable interpolation data is generated. As for the determination of the image pattern, a pair of two pixels are selected from pixels on the lines located above and below the white defect pixel, and processing of determining whether there is correlation between pixel values of the selected pixels is repetitively executed until a image pattern near the white defect pixel is determined.
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