发明名称 Nonvolatile semiconductor memory device that can suppress effect of threshold voltage variation of memory cell transistor
摘要 In a memory block that is to be subjected to an erasure operation, voltage of the ground level is selectively supplied to only one word line. By applying an erasure pulse to a source line, memory cell transistors have their threshold voltages shifted. As to another word line, a pulse of a positive voltage is supplied in synchronization to the application of an erasure pulse to the source line. Another group of memory cell transistors do not have their threshold voltages shifted.
申请公布号 US2003043629(A1) 申请公布日期 2003.03.06
申请号 US20020200773 申请日期 2002.07.24
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 TOMOEDA MITSUHIRO;OHBA ATSUSHI;MAKINO TOSHIMASA
分类号 G11C16/02;G11C16/06;G11C16/14;G11C16/16;G11C16/34;(IPC1-7):G11C11/34 主分类号 G11C16/02
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