发明名称 METHOD FOR DEPOSIT COPPER ON METAL FILMS
摘要 A method for improving adhesion of copper films to transition metal based barrier layers. Tantalum or other transition metal based barrier layers are deposited by chemical vapor deposition techniques using transition metal halide precursor materials which generate halogen atom impurities in the barrier layer. The barrier layer is treated with a plasma generated from a nitrogen-containing gas, such as ammonia. Halogen impurity levels are thereby decreased at the surface of the barrier layer. On this surface is subsequently applied a copper film by physical vapor deposition. The copper film exhibits improved adherence to the barrier layer.
申请公布号 WO02058115(B1) 申请公布日期 2003.03.06
申请号 WO2001US45203 申请日期 2001.10.31
申请人 TOKYO ELECTRON LIMITED;TOKYO ELECTRON ARIZONA, INC. 发明人 HILLMAN, JOSEPH, T.;WAJDA, CORY, S.;CALIENDO, STEVEN, P.
分类号 C23C16/14;C23C16/34;C23C16/448;C23C16/56;(IPC1-7):H01L21/00;C23C14/16;H01L21/768 主分类号 C23C16/14
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