发明名称 PROBE CONTROL APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a probe control apparatus that can be applied to a sample where an insulating region and a high electric resistance region are mixed, does not use laser beams for decreasing an S/N ratio when measuring weak emission by a tunnel current, can use a probe suited for use as a conductive focusing probe, and can apply voltage between the tip of the probe and the sample. SOLUTION: In the probe control apparatus, a gap 4 is controlled by controlling a rod-like probe 1 that is vertical to the surface of a sample 3, a vibrator 7 for vibration for vibrating the probe 1 in a direction that orthogonally crosses a center axis, a vibrator 10 for sensing that detects the amplitude of the probe 1, and the amplitude of the probe 1 to a specific amplitude. In the probe control apparatus, the probe 1 has a light transmission property and conductivity, a probe bias power supply 14 for applying a voltage between the tip of the probe 1 and the sample 3 is provided, and the area between the vibrator 10 for sensing and the probe 1 is electrically insulated by an insulating material 81.
申请公布号 JP2003065932(A) 申请公布日期 2003.03.05
申请号 JP20010256206 申请日期 2001.08.27
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 MURASHITA TATSU
分类号 G01Q10/04;G01Q20/04;G01Q60/10;(IPC1-7):G01N13/10 主分类号 G01Q10/04
代理机构 代理人
主权项
地址
您可能感兴趣的专利