发明名称 |
METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD, METHOD FOR MEASURING CURRENT WAVEFORM AND METHOD FOR MEASURING ELECTRIC FIELD |
摘要 |
PROBLEM TO BE SOLVED: To provide a method and an apparatus for measuring a high frequency magnetic field or electric field varying repeatedly at a high speed with a high spatial resolution. SOLUTION: An electron beam deflected by passing through a magnetic field or an electric field to be measured is passed through an electrostatic deflector and deflected, at a constant speed, in the direction perpendicular to the magnetic field or electric field being measured. Locus of the deflected electron beam is then detected by means of a two-dimensional detector to obtain a waveform or a figure where the time axis is orthogonal to the axis of a magnetic field under observation.
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申请公布号 |
JP2003066126(A) |
申请公布日期 |
2003.03.05 |
申请号 |
JP20010259155 |
申请日期 |
2001.08.29 |
申请人 |
HITACHI LTD |
发明人 |
SUZUKI HIROSHI;SHIMAKURA TOMOKAZU;NAKAMURA KIMIO |
分类号 |
G01R33/028;G01R19/00;G01R33/02;G11B5/455;H01J37/04;H01J37/147;(IPC1-7):G01R33/028 |
主分类号 |
G01R33/028 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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