发明名称 METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD, METHOD FOR MEASURING CURRENT WAVEFORM AND METHOD FOR MEASURING ELECTRIC FIELD
摘要 PROBLEM TO BE SOLVED: To provide a method and an apparatus for measuring a high frequency magnetic field or electric field varying repeatedly at a high speed with a high spatial resolution. SOLUTION: An electron beam deflected by passing through a magnetic field or an electric field to be measured is passed through an electrostatic deflector and deflected, at a constant speed, in the direction perpendicular to the magnetic field or electric field being measured. Locus of the deflected electron beam is then detected by means of a two-dimensional detector to obtain a waveform or a figure where the time axis is orthogonal to the axis of a magnetic field under observation.
申请公布号 JP2003066126(A) 申请公布日期 2003.03.05
申请号 JP20010259155 申请日期 2001.08.29
申请人 HITACHI LTD 发明人 SUZUKI HIROSHI;SHIMAKURA TOMOKAZU;NAKAMURA KIMIO
分类号 G01R33/028;G01R19/00;G01R33/02;G11B5/455;H01J37/04;H01J37/147;(IPC1-7):G01R33/028 主分类号 G01R33/028
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