CHARACTERISTIC EVALUATION CIRCUIT AND CHARACTERISTIC EVALUATION METHOD FOR TRANSISTOR

摘要

PROBLEM TO BE SOLVED: To provide a characteristic evaluation circuit and a characteristic evaluation method for a transistor capable of statistically analyzing characteristics of a plurality of transistors. SOLUTION: The characteristic evaluation circuit is provided with a plurality of measurement transistors 9 which are objects to be measured arranged in a matrix, decoders 1 and 2 and selecting transistors 5 and 6 selecting one from the measurement transistors 9, and DC power units 3 and 4 applying a predetermined voltage to a selected particular transistor. Operations of the particular transistor are individually measured.