发明名称 Process for fabricating of thin nitride- or oxide layers
摘要 Production of thin oxide or nitride layers comprises using a plasma beam produced from a high frequency plasma source (5) to convert the substrate (1) into the corresponding oxide or nitride and adjusting the reaction speed independent of the penetration depth. Preferred Features: The reaction speed is adjusted over the ion stream density of the particle stream or the degree of ionization or dissociation of the particle stream. The energy of the ions is uniform. The process is carried out at less than 10<-2> mbar pressure and at 54-150 degrees C. The substrate material is aluminum, magnesium, gallium, tantalum, zinc, titanium, zirconium, yttrium, nickel, silicon, germanium, boron or carbon.
申请公布号 EP1288329(A1) 申请公布日期 2003.03.05
申请号 EP20010121046 申请日期 2001.09.03
申请人 C C R GMBH BESCHICHTUNGSTECHNOLOGIE 发明人 HILLEBRANDS, BURKARD, PROFESSOR DR.;DEMOKRITOV, SERGUEI O., DR.;ROOS, BJOERN F.P.;WEILER, MANFRED, DR.;DAHL, ROLAND
分类号 C23C8/36 主分类号 C23C8/36
代理机构 代理人
主权项
地址