| 摘要 |
PROBLEM TO BE SOLVED: To precisely measure distribution data for charging characteristic and sensitivity characteristic over the whole surface of a photoconductor such as photoreceptor in a short time. SOLUTION: When the surface of a photoreceptor drum 2 is charged to measure the surface potential, a surface potentiometer 5 is moved in the axial direction of the photoreceptor drum 2 in the same direction as the moving direction of charging with a charging unit 3 at the same speed as the moving speed of the charging unit 3, and the surface potential of the charged photoreceptor drum 2 or the charged and exposed photoreceptor drum 2 is measured, whereby the surface potential distribution of the photoreceptor drum 2 can be precisely measured in each position of the photoreceptor drum 2 under the same measuring condition of surface potential.
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