| 摘要 |
PROBLEM TO BE SOLVED: To provide a testing circuit for semiconductor products that can test semiconductor products in a short times with a compact control circuit. SOLUTION: A control circuit 3 for testing is composed compactly while it is also used as a TAP controller of a BS circuit. A test code signal Ftc is stored at registers 7a-7d in a test code signal storage circuit 7 by a control signal Fc that is created by the control circuit 4 for testing based on a mode selection signal Fms. A specific internal test is made to the semiconductor products due to the selective drive of test circuits 11a-11n caused by a test drive signal that is outputted corresponding to a decoding operation from a decoder 5. Even if an internal test scale expands due to the increase in the number of test circuits, the scale of the control circuit 3 for testing need not be expanded, the test code signal Ftc is stored at corresponding registers 7a-7d by the control of the control signal Fc for executing corresponding internal tests, thus reducing the test time by the reduction of the storage time of the test code signal Fc to the registers 7a-7d.
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