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发明名称
Testable circuit with reduced pin count
摘要
申请公布号
EP0875830(B1)
申请公布日期
2003.03.05
申请号
EP19980410043
申请日期
1998.04.28
申请人
STMICROELECTRONICS S.A.
发明人
PRUNIER, JACQUES
分类号
G06F11/36;(IPC1-7):G06F11/00
主分类号
G06F11/36
代理机构
代理人
主权项
地址
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