| 摘要 |
PROBLEM TO BE SOLVED: To reduce an offset load applied to a test piece and at the same time miniaturize a test piece-gripping apparatus and reduce its weight. SOLUTION: A lower screw flange 4 where a test piece 1 is screwed is fixed to a lower chuck body 2 via a spacer flange 3 by using a bolt 5. A plurality of members comprising a plurality of laminated belleville springs 10 and belleville guides 11 are provided on the spacer flange 3. In a state before clamping by a bolt, the tip of the belleville guide 11 projects from the upper surface of the spacer flange 3 by D, so that a gap is formed between the lower screw flange 4 and the spacer flange 3. By clamping the bolt 5 so that the gap is eliminated, an offset load applied to the test piece 1 can be eliminated. A flange 16 that is fitted to the upper screw flag 16 is mounted by a bolt 17 to eliminate the same gap also for the upper chuck.
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