| 摘要 |
Test strip compression elements for use with test strip assay system and methods for their use are provided. The subject test strip compression elements are configured to create a substantially intimate, evenly distributed contact between a test strip and a heating element of a meter when the test strip is operatively inserted into the meter. In certain embodiments, the subject test strip compression elements may further include one or more protrusions on the contact side of the test strip compression element. In other embodiments , the compression elements may be spring-loaded. Still other embodiments may inclu de a compression element having one or more protrusions, as well as being spring- loaded. Also provided are meters on which the subject test strip compression elements are present, as well as methods for using the same. Kits are also provided that include the subje ct test strip compression elements for use in practicing the subject methods.
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