| 摘要 |
A semiconductor device capable of improving a yield rate in a semiconductor testing process. The semiconductor device includes a measuring object circuit, a pattern generation circuit for generating a test pattern used for testing the operation of the measuring object circuit, a data output terminal for outputting a test result generated by the measuring object circuit when the test pattern is given to the measuring object circuit, a register for storing the test result when the test is performed, an oscillator for generating and giving a clock with a frequency used for the test to the measuring object circuit, a controller for controlling a test interval signal indicating a test interval for the test to be active for a predetermined cycle by synchronizing with the oscillator after receiving the activation signal, a delay circuit for delaying the clock for a predetermined time, and a ripple counter for dividing the clock delayed by the delayed circuit.
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