发明名称 APPARATUS PROCESSING A GATE PORTION IN A SEMICONDUCTOR MANUFACTURING APPARATUS, WHICH REMOVE A GATE CORRESPONDENCE PORTION FROM A SEMICONDUCTOR PACKAGE CONNECTED TO A LEAD FRAME, AND A RESIN BURR DEPOSITED ON A LEAD PORTION ASSOCIATED WITH THE SEMICONDUCTOR PACKAGE
摘要 An apparatus processing a gate portion in a semiconductor manufacturing apparatus includes a laser beam scanner unit and a cutter. The laser beam scanner unit is disposed along a carrying line on which a lead frame is carried. The laser beam scanner unit has an optical scanner unit second-dimensionally scanning laser beams, and a lens unit collecting the laser beams. The cutter has a punch. The punch mechanically pushes to cut a gate correspondence portion which is perfectly cut away or almost cut away from a semiconductor package body by the laser beams.
申请公布号 US6528757(B2) 申请公布日期 2003.03.04
申请号 US20010870218 申请日期 2001.05.30
申请人 NEC CORPORATION 发明人 TAKAHASHI TAKEHIKO
分类号 B21D28/00;B23K26/00;B23K26/40;B23K101/40;H01L21/48;H01L21/56;(IPC1-7):B23K26/38 主分类号 B21D28/00
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