| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device, the visual inspection of which is easy. SOLUTION: The semiconductor device 101 has a semiconductor substrate 103. A level difference part 107 is formed in the peripheral region of the rear face 105 of the semiconductor substrate 103. This level difference part 107 plays the role of acting to make the diffused reflection of laser beam used by an appearance inspection device. Consequently, even if the semiconductor device 101, whose rear surface is in a state of a mirror surface is mounted to a mounted substrate, a difference between the intensity of the laser beams reflected by the semiconductor device 101 and the intensity of the laser beams reflected by the mounted substrate is enhanced, thereby appearance inspection can be performed easily. |
