发明名称 METHOD FOR DEPOSITING THIN FILM FOR MAGNETIC HEAD
摘要 PROBLEM TO BE SOLVED: To obtain an insulating layer having high dielectric breakdown voltage and large step coverage for a magnetic reading head. SOLUTION: The structure and the method for manufacturing a magnetic reading head include a process of forming a fill layer for a magnetic reading head gap by using an atomic layer deposition(ALD) method. The fill layer contains an insulating material, preferably aluminum oxide, aluminum nitride, their mixture or layered structure. Alternatively, a material having a thermal conductivity higher than aluminum oxide (such as beryllium oxide and boron nitride) may be used in a layer in the aluminum oxide structure. The thickness of the head gap fill layer formed by the ALD method is in the range from about 5 nm to 100 nm, more preferably from about 10 nm to 40 nm.
申请公布号 JP2003059016(A) 申请公布日期 2003.02.28
申请号 JP20020135407 申请日期 2002.05.10
申请人 ASM MICROCHEMISTRY OY 发明人 HUJANEN JUHA
分类号 C23C16/44;C08F2/46;G11B5/235;G11B5/31;G11B5/39;H01L43/08;H01L43/12;(IPC1-7):G11B5/39 主分类号 C23C16/44
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