发明名称 SPIN DRYER
摘要 PROBLEM TO BE SOLVED: To protect a semiconductor wafer against damages, while automating the processing thereof by correcting an offset load existing between two cradles automatically, thereby suppressing vibration during rotation. SOLUTION: Weight of a single semiconductor wafer 31 is prestored, and an offset load produced between two cradles 16A and 16B is calculated previously from the number of inputted semiconductor wafers 31. A dummy weight 32 is moved to a position for canceling the calculated offset load.
申请公布号 JP2003059893(A) 申请公布日期 2003.02.28
申请号 JP20010246748 申请日期 2001.08.15
申请人 AE TECHNO KK;TSUKUBA KK 发明人 SAKAMAKI HIROSHI;HIRATSUKA HISAYOSHI
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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