发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To form a capacitor in which capacitance per unit volume is large, voltage dependence is low, and the absolute level is a MOS transistor level only by adding a mask in a process of manufacturing a BicMOS-type semiconductor device. SOLUTION: This method comprises the steps of forming a collector wall 103 in a bipolar transistor collector (C) and, at the same time, forming a conductive region 103 similar to the collector wall in a capacitor (A), forming a nitride film 106 on the collector wall 103 and the conductive region 103 formed in the capacitor (A), forming an oxide film on the whole surface to oxidize a gate, forming a gate electrode 108 in a CMOS unit (B), and, at the same time, forming an upper wiring layer 108 on the capacitor (A).
申请公布号 JP2003060097(A) 申请公布日期 2003.02.28
申请号 JP20010247801 申请日期 2001.08.17
申请人 MITSUBISHI ELECTRIC CORP;RYODEN SEMICONDUCTOR SYST ENG CORP 发明人 OTSU YOSHITAKA;IGARASHI TAKAYUKI
分类号 H01L27/04;H01L21/822;H01L21/8222;H01L21/8234;H01L21/8248;H01L21/8249;H01L27/06;(IPC1-7):H01L21/824;H01L21/823 主分类号 H01L27/04
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