发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device having an element isolation region coincident with a surface of a semiconductor substrate. SOLUTION: The method for manufacturing a semiconductor device includes a process for forming a trench between a first mask covering an active region of the semiconductor substrate and a second mask having a surface area larger than that of the first mask, a process for depositing insulating material in the trench and on the masks, a process for applying CMP to the insulating material until a surface of the first mask is exposed, a process or newly depositing insulating material on the first mask and the residual insulating material, and a process for applying CMP to the insulating material containing the new insulating material until a surface of the second mask is exposed.
申请公布号 JP2003060023(A) 申请公布日期 2003.02.28
申请号 JP20010247059 申请日期 2001.08.16
申请人 OKI ELECTRIC IND CO LTD 发明人 OGASAWARA HIROMI
分类号 H01L21/76;H01L21/762;(IPC1-7):H01L21/76 主分类号 H01L21/76
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