发明名称 METHOD AND SYSTEM FOR TESTING INFORMATION PROCESSOR
摘要 PROBLEM TO BE SOLVED: To avoid erroneously determining the normal operation of an inspecting object to be abnormal operation due to the dynamic response change of the inspecting object. SOLUTION: In an environmental logic being pseudo processors (IP) 110 and 120, a means 111 for holding an inspection instructing string and sending it to a logic unit (SC) 100 being the inspecting object, a means 113 for generating the expected values of inspection instructions, a means 116 for performing the comparing calculation of an expected value and response value from the logic unit, a means 117 reflecting the result of comparing calculation and a means 118 for changing the performing order of the inspection instruction string by the result of comparing calculation are provided. When the response value of the logic unit changes dynamically, the performing order of the inspection instruction string is changed dynamically to determine whether the operation of the logic unit is normal or abnormal by the performing order of the inspection instructions.
申请公布号 JP2003058390(A) 申请公布日期 2003.02.28
申请号 JP20010249923 申请日期 2001.08.21
申请人 HITACHI LTD 发明人 HONMA KAZUKI;KUROKAWA HIROSHI;TAKEDA GENICHI
分类号 G01R31/28;G06F11/22 主分类号 G01R31/28
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