发明名称 SEMICONDUCTOR MEMORY
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor memory having a redundancy system having high relieving efficiency. SOLUTION: This memory is provided with a plurality of first normal elements comprising assembly of memory cells of a first direction and a first selecting line for selecting the assembly, a plurality of second normal elements comprising assembly of memory cells of a second direction and a second selecting line for selecting the assembly and selecting a memory cell cooperating with the first normal element corresponding respectively, a plurality of first redundant elements arranged to replace a defective first normal element, and a plurality of second redundant elements arranged to replace a defective second normal element. At least two elements of the first normal elements are simultaneously activated, they are independently controlled as to they are replaced by the first redundant elements or not, one of the second redundant elements replacing a defective second normal element within a first relieving region including one of the first normal element activated simultaneously does not intersect with one of the first normal elements activated simultaneously.
申请公布号 JP2003059289(A) 申请公布日期 2003.02.28
申请号 JP20020161441 申请日期 2002.06.03
申请人 TOSHIBA CORP 发明人 KATO DAISUKE;YOSHIDA MUNEHIRO;WATANABE YOJI
分类号 H01L27/10;G11C29/00;G11C29/04;(IPC1-7):G11C29/00 主分类号 H01L27/10
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