| 摘要 |
PROBLEM TO BE SOLVED: To provide an image quality inspection apparatus that can easily eliminate moire caused by an unemission part such as a barrier and an electrode or the like in a display device such as a plasma display device without using a high definition CCD camera and a high-speed image processor so as to detect a pixel defect such as a black point (unemitted pixel) or the like at a high-speed. SOLUTION: The electronic display image quality inspection apparatus for imaging an electronic display screen to inspect a defect caused in pixels of an electronic display device by using the image, is provided with a means that moves an imaging element photographing the electronic displays screen by a prescribed distance in longitudinal and lateral directions, a means that integrates the image photographed by each movement in terms of frames, and a means that inspects a pixel defect of the electronic display device from the image whose frames are integrated. |
