发明名称 Method of making thermally stable planarizing films
摘要 Disclosed is a method of protecting semiconductor areas while exposing a structures for processing on a semiconductor surface, the method comprising depositing a planarizing high density plasma film of a silicon compound, selected from the group silicon oxide and silicon nitride, depositing a planarized polymer film to a thickness effective in protecting said high density plasma film while leaving high density plasma excess exposed, and etching away said high density plasma excess.
申请公布号 US2003038109(A1) 申请公布日期 2003.02.27
申请号 US20010938097 申请日期 2001.08.23
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION, ARMONK, NEW YORK, 发明人 DOKUMACI OMER H.;DORIS BRUCE B.;BELYANSKY MICHAEL P.
分类号 H01L21/3105;H01L21/768;(IPC1-7):H01L21/302 主分类号 H01L21/3105
代理机构 代理人
主权项
地址