发明名称 ELECTRONIC DEVICE AND METHOD OF TESTING AND OF MANUFACTURING
摘要 <p>The electronic device (10) comprises a capacitor (12) and an inductor (11) and is present on a substrate (1) with an unplanarized surface (2). This is realized in winding (21) of the inductor (11) has a thickness of at least 1 micron and has a planarized upper surface (81). The upper electrode (32) of the capacitor is present in a second electrode layer (6) and has a lower surface (82) which is spaced from the substrate (1) by a larger distance than the upper surface (81) of the lower electrode (31). The second electrode layer (6) preferably includes a second winding (22) of the inductor (11). The electronic device (10) is suitable for use at high frequencies.</p>
申请公布号 WO2003017479(A2) 申请公布日期 2003.02.27
申请号 IB2002003230 申请日期 2002.08.14
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